Structural analysis of thermal oxide layers grown on Zircaloy-4 established with the help of chemically homogeneous sputter-deposited Zr-O thin films
- 8 October 1993
- journal article
- Published by Elsevier in Surface and Coatings Technology
- Vol. 60 (1-3) , 405-410
- https://doi.org/10.1016/0257-8972(93)90122-5
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Mechanisms of built-up layer formation on turning tools: Influence of tool and workpieceWear, 1992
- Caractérisation par microscopie électronique à transmission d'une solution solide Zr-O localement ordonnée obtenue à l'issue d'un traitement d'oxydation sur un alliage de type Zircaloy-4Journal of Alloys and Compounds, 1991
- Mise en evidence d'une phase omega dans des films minces de zirconium et zirconium-oxygene realises par pulverisation cathodique magnetronScripta Metallurgica et Materialia, 1991
- Intrinsic size dependence of the phase transformation temperature in zirconia microcrystalsJournal of Materials Science, 1986
- The O−Zr (Oxygen-Zirconium) systemBulletin of Alloy Phase Diagrams, 1986
- Ion-based methods for optical thin film depositionJournal of Materials Science, 1986
- Electron diffraction from ZrO2 on αZr(1010)Journal of Nuclear Materials, 1983
- Microstructure control for sputter-deposited ZrO2, ZrO2·CaO and ZrO2·Y2O3Thin Solid Films, 1982
- Nature and Thermal Evolution of Amorphous Hvdrated Zirconium OxideJournal of the American Ceramic Society, 1968