Bias and temperature dependence of gate and substrate currents in n-MOSFETS at low drain voltage
- 17 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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- Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETsIEEE Transactions on Electron Devices, 1990
- Substrate current at cryogenic temperatures: Measurements and a two-dimensional model for CMOS technologyIEEE Transactions on Electron Devices, 1987
- Impact ionization at very low voltages in siliconJournal of Applied Physics, 1982