Feedback-Controlled X-Ray diffraction topography
- 16 November 1970
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 3 (3) , 687-696
- https://doi.org/10.1002/pssa.19700030315
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- New X-Ray Diffraction Microscopy Technique for the Study of Imperfections in Semiconductor CrystalsJournal of Applied Physics, 1965
- Direct Observation of Individual Dislocations by X-Ray DiffractionJournal of Applied Physics, 1958
- Method for the Study of Lattice Inhomogeneities Combining X-Ray Microscopy and Diffraction AnalysisJournal of Applied Physics, 1956
- Sur deux variantes de la méthode de Laue et leurs applicationsActa Crystallographica, 1949
- Über eine röntgenographische Methode zur Untersuchung von Gitterstörungen an KristallenThe Science of Nature, 1931