Influence of the Al2O3(0001) surface reconstruction on the Cu/Al2O3 interface
- 2 June 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 249 (1-3) , L327-L332
- https://doi.org/10.1016/0039-6028(91)90822-a
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- The interface formation as studied by electron spectroscopiesSurface Science, 1990
- Electronic structure of metal–sapphire interfacesSurface and Interface Analysis, 1990
- An XPS, EELS and LEED study of monocrystalline Al2O3 (0001) surfaces: Modifications induced by heat treatment or ion bombardmentSurface and Interface Analysis, 1990
- Charge transfer and core-hole screening in PbTePhysical Review B, 1989
- Copper growth on Al2O3 and Al: An auger studySurface Science, 1987
- Cu deposition on Al2O3 and AlN surfaces: Electronic structure and bondingJournal of Applied Physics, 1987
- Photoemission study of two model catalysts using synchrotron radiationSurface Science, 1985
- Studies of the charging of insulators in ESCAJournal of Electron Spectroscopy and Related Phenomena, 1980
- A new approach to identifying chemical states, comprising combined use of Auger and photoelectron linesJournal of Electron Spectroscopy and Related Phenomena, 1977
- Composition and surface structure of the (0001) face of .alpha.-alumina by low-energy electron diffractionThe Journal of Physical Chemistry, 1970