Specimen Damage during Microprobe Analysis of Silicate Glasses
- 1 January 1969
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Changes in Composition during Electron Micro-Probe Analysis of K2O–SrO–SiO2 GlassJournal of Applied Physics, 1966
- X-Ray-Emission Microanalysis of Rock-Forming Minerals IV. Plagioclase FeldsparsThe Journal of Geology, 1966
- Oxygen Outgassing Caused by Electron Bombardment of GlassJournal of Applied Physics, 1963