Thermal Fatigue Failure of Soft-Soldered Contacts to Silicon Power Transistors
- 1 September 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Parts, Hybrids, and Packaging
- Vol. 13 (3) , 318-321
- https://doi.org/10.1109/tphp.1977.1135203
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Reliability and thermal impedance studies in soft soldered power transistorsIEEE Transactions on Electron Devices, 1976
- Thermal fatigue in silicon power transistorsIEEE Transactions on Electron Devices, 1970
- Estimating fatigue lifetime of power-cycled solid-state switchesIEEE Transactions on Electron Devices, 1970
- Thermal stresses and fatigue in silicon power rectifiersIEEE Transactions on Communication and Electronics, 1964