The C-V method for characterizing ISFET or EOS devices with ion-sensitive membranes
- 1 June 1990
- journal article
- Published by Elsevier in Journal of Electroanalytical Chemistry and Interfacial Electrochemistry
- Vol. 286 (1-2) , 23-40
- https://doi.org/10.1016/0022-0728(90)85062-a
Abstract
No abstract availableKeywords
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