Abstract
The planarity of the (00001) planes in the decagonal quasicrystal Al65Cu16Co15Si4, is investigated by a further developed electron channelling technique, which is based on the dependence of the X-ray yield on the direction of the incident electron beam. It is found that Si atoms are located midway between the (00001) planes containing the Co, Cu and Al atoms. This result is discussed in terms of the electronic properties of Al and Si. A straightforward explanation is given for the phase transition of Al65-xCo20Cu15Six from decagonal (x4.5).

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