A solution of the mask overlay problem in microelectromechanical CAD (MEMCAD)
- 1 January 1992
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A wafer-bonded silicon load cell operating in the tensioned-wire regimePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Silicon pressure sensor integrates resonant strain gauge on diaphragmSensors and Actuators A: Physical, 1990
- Automatic generation of a 3-D solid model of a microfabricated structurePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1990
- Primitives for the manipulation of general subdivisions and the computation of VoronoiACM Transactions on Graphics, 1985