Impurity-induced pipes through diffused layers in silicon
- 1 March 1962
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 5 (2) , 61-IN6
- https://doi.org/10.1016/0038-1101(62)90018-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Impurity Redistribution and Junction Formation in Silicon by Thermal OxidationBell System Technical Journal, 1960
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- Properties of Gold-Doped SiliconPhysical Review B, 1957