Novel method to determine capture cross-section activation energies by deep-level transient spectroscopy techniques

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Abstract
Deep-center characterization by deep-level transient spectroscopy (DLTS) allows a direct determination of the trap thermal emission activation energy. However, capture barrier energy measurements, based on trap partial filling by pulses of increasing width, require a quite different experimental processing and pose some hardware difficulties. In this letter we present a new method to determine the trap capture barrier energy, one that requires constant-width filling pulses and obtains capture information from standard DLTS data. This technique has been applied to Te-, Sn-, and Si-related DX centers in AlGaAs alloys.