Comments on “pseudo first principle” calculations of Auger sensitivity factors
- 1 October 1984
- journal article
- Published by Elsevier in Surface Science
- Vol. 145 (2-3) , L501-L503
- https://doi.org/10.1016/0039-6028(84)90075-x
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- The effect of surface roughness on XPS and AESSurface Science, 1984
- Calculated Auger sensitivity factors compared to experimental handbook valuesSurface Science, 1983
- The elastic scattering factor in Auger electron spectroscopySurface Science, 1983
- ESCA signal intensity dependence on surface area (roughness)Applications of Surface Science, 1982
- Matrix effects in quantitative auger analysis of dilute alloysSurface Science, 1979
- EditorialSurface and Interface Analysis, 1979
- Quantitative chemical analysis by ESCAJournal of Electron Spectroscopy and Related Phenomena, 1976