ESCA signal intensity dependence on surface area (roughness)
- 31 July 1982
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 11-12, 118-130
- https://doi.org/10.1016/0378-5963(82)90058-7
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Interpretation of AES depth profiles of porous Al anodic oxidesApplications of Surface Science, 1980
- The development of surface shape during sputter‐depth profiling in Auger electron spectroscopySurface and Interface Analysis, 1980
- The development of surface topography during depth profiling in auger electron spectroscopySurface Science, 1979
- Depth resolution and surface roughness effects in sputter profiling of NiCr multilayer sandwich samples using Auger electron spectroscopyThin Solid Films, 1977
- Reduction of ion sputtering yield by special surface microtopographyApplied Physics Letters, 1977
- Sputtering in the surface analysis of solids: A discussion of some problemsJournal of Vacuum Science and Technology, 1976
- The effect of surface roughness on Auger electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1975
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Surface analysis and angular distributions in x-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Techniques for elemental composition profiling in thin filmsC R C Critical Reviews in Solid State Sciences, 1973