Interpretation of AES depth profiles of porous Al anodic oxides

This publication has 21 references indexed in Scilit:

• Characterization of anodized aluminium—Copper vapour-deposited films by ion scattering spectrometry
  Corrosion Science, 1979
• Oxide morphologies on aluminum prepared for adhesive bonding
  Applications of Surface Science, 1979
• STEM/EDAX Analysis of the Cell Walls in Porous Anodic Films Formed on Aluminum
  Journal of the Electrochemical Society, 1978
• Effects of chemical and thermal treatments on the composition of 2024 aluminum adherend surfaces
  Applications of Surface Science, 1978
• Caracterisation par spectrometrie auger de films anodiques formes sur l'aluminium
  Materials Research Bulletin, 1977
• A study of barrier film growth on aluminium in solutions of film-promoting and aggressive ions using secondary ion mass spectrometry
  Corrosion Science, 1976
• Deconvolution method for composition profiling by Auger sputtering technique
  Surface Science, 1976
• Techniques for elemental composition profiling in thin films
  C R C Critical Reviews in Solid State Sciences, 1973
• Experimental Investigation of the Cylindrical Mirror Analyzer with a 2π-Thermionic Electron Source
  Journal of Vacuum Science and Technology, 1972
• Structural Features of Oxide Coatings on Aluminum
  Journal of the Electrochemical Society, 1953