Change of optical properties during the monitoring of quarter wave multilayers
- 31 December 1979
- journal article
- Published by Elsevier in Optics Communications
- Vol. 31 (3) , 259-262
- https://doi.org/10.1016/0030-4018(79)90192-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Automatic evaluation of optical constants and thickness of thin films: application to thin dielectric layersNouvelle Revue d'Optique, 1976
- The Effect of Errors in the Optical Monitoring of Narrow-band All-dielectric Thin Film Optical FiltersOptica Acta: International Journal of Optics, 1974
- Influence du Procédé de Contrôle Sur Les Tolérances de Réalisation des Filtres Interférentiels à Bande EtroiteOptica Acta: International Journal of Optics, 1973
- Optical filters: Monitoring process allowing the auto-correction of thickness errorsThin Solid Films, 1972
- Contr le et r alisation de rev tements multidi lectriques pr sentant des caract ristiques spectrales impos esNouvelle Revue d'Optique Appliquée, 1972