Device Testing and Sem Testing Tools

This publication has 4 references indexed in Scilit:

• Energy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testing
  Microelectronic Engineering, 1986
• 400 Mbit/s CMI transmission experiment using a 1.3 μm LED
  Electronics Letters, 1985
• Optical scanning microscopy—The laser scan microscope
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• The use of marginal voltage measurements to detect and locate defects in digital microcircuits
  Microelectronics Reliability, 1982