An experimental and theoretical analysis of the temperature profile in semiconductor laser diodes using the photodeflection technique
- 1 September 1995
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 6 (9) , 1278-1290
- https://doi.org/10.1088/0957-0233/6/9/007
Abstract
No abstract availableKeywords
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