A characteristic feature of crystalline thin-film growth of Si on a 7 × 7 superlattice surface of Si(111)
- 1 September 1996
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 166 (1-4) , 617-621
- https://doi.org/10.1016/0022-0248(95)00940-x
Abstract
No abstract availableKeywords
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