The quantitative calculation of SiC polytypes from measurements of X-ray diffraction peak intensities
- 1 August 1979
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science
- Vol. 14 (8) , 2013-2017
- https://doi.org/10.1007/bf00551044
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Revised X-ray diffraction line intensities for silicon carbide polytypesJournal of Applied Crystallography, 1969
- A review of the structure of silicon carbideActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969