Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scattering
- 1 December 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 31 (4) , 437-453
- https://doi.org/10.1016/0304-3991(89)90340-9
Abstract
No abstract availableKeywords
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