Simplified Analysis of Electron-Hole Recombination in Zn- and O-Doped GaP

Abstract
An analysis of the recombination kinetics of three differently annealed GaP samples of a crystal doped with Zn and O is presented. The kinetics are described in terms of four parameters: a hole recombination lifetime T1; an emission rate e1 for electrons to be thermally excited from the Zn-O center back into the conduction band; a shunt-path lifetime TSH and a rate c1 for capture of electrons by the Zn-O centers. Rate e1 had been previously determined by Jayson, Bachrach, Dapkus, and Schumaker. Two other parameters T1 and (TSH1+c1) were directly measured. TSH and c1 were separately determined by evaluating the ratio TSH1(TSH1+c1), which is the fraction of the carriers leaving the conduction band through the shunt path. This ratio was deduced in two independent ways from analysis of the time dependence of the red and green luminescence. In the most efficient sample, the parameters at 298 K were e11=220±10 nsec, T1=630±30 nsec, TSH=60±10 nsec, and c11=10±1 nsec. About 0.60 ± 0.05 of the recombination in this sample was through the Zn-O centers. The measured radiative efficiency was 0.29 ± 0.03, indicating that about half the recombination was radiative. The radiative and nonradiative hole recombination times were (T1)rad=1310±130 nsec and (T1)nonrad=1210±90 nsec for this sample with p2×1017cm3 (NAND=2.5×1017cm3). These lifetimes are in good agreement with those deduced previously by Jayson, Bhargava, and Dixon. The effect of annealing is to change TSH from about 5 to 60 nsec and to increase the Zn-O center concentration by 5 or 6 times. These changes increased the recombination through the Zn-O...