Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments
- 1 June 1970
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (6) , 759-788
- https://doi.org/10.1016/0038-1101(70)90064-x
Abstract
No abstract availableKeywords
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