Interface Failure in Lead Free Solder Joints
- 10 July 2006
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Effect of Ni-P Thickness on the Tensile Strength of Cu/Electroless Ni-P/Sn-3.5Ag Solder JointPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Influence of Solder Volume on Interfacial Reaction between Sn-Ag-Cu Solder and TiW/Cu/Ni UBMPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- Solder Joint Integrity of Various Surface Finished Build-Up Flip Chip Packages by 4-point Monotonic Bending TestPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2006
- BGA brittle fracture - alternative solder joint integrity test methodsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- The effect of Au plating thickness of BGA substrates on ball shear strength under reliability testsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003