Complete Linear Characterization of Transistors from Low Throug very High Frequencies
- 1 March 1957
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Instrumentation
- Vol. I-6 (1) , 49-63
- https://doi.org/10.1109/IRE-I.1957.5006670
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- IRE Standards on Solid-State Devices: Methods of Testing Transistors, 1956Proceedings of the IRE, 1956
- A Precise Sweep-Frequency Method of Vector Impedance MeasurementProceedings of the IRE, 1951
- A Precise Direct Reading Phase and Transmission Measuring System for Video FrequenciesBell System Technical Journal, 1949