Determination of atomic positions using electron nanodiffraction patterns from overlapping regions: Si[110]
- 31 August 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 30 (3) , 371-384
- https://doi.org/10.1016/0304-3991(89)90068-5
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Image reconstruction using electron microdiffraction patterns from overlapping regionsUltramicroscopy, 1986
- Microdiffraction and stem of interfacesUltramicroscopy, 1984
- The extension of scanning transmission electron microscopy by use of diffraction informationUltramicroscopy, 1976