The extension of scanning transmission electron microscopy by use of diffraction information
- 31 December 1976
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (3-4) , 255-262
- https://doi.org/10.1016/0304-3991(76)90039-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A practical method of three-dimensional space-group analysis using convergent-beam electron diffractionActa Crystallographica Section A, 1975
- Development of methodology for low exposure, high resolution electron microscopy of biological specimensUltramicroscopy, 1975
- Molecular structure determination by electron microscopy of unstained crystalline specimensJournal of Molecular Biology, 1975
- A scanning microscope with 5 Å resolutionJournal of Molecular Biology, 1970
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Electron diffraction study of MgOh00-systematic interactionsActa Crystallographica, 1967