Characterization of microstructure in ion-implanted garnet by transmission electron microscopy

Publisher Website

1 September 1983

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics

Vol. 19 (5) , 1823-1825
https://doi.org/10.1109/tmag.1983.1062709

Abstract

No abstract available

This publication has 6 references indexed in Scilit:

Investigations of ion-implantable submicron bubble material
IEEE Transactions on Magnetics, 1982
Strain profiles in ion-implanted bubble devices investigated by transmission electron diffraction
Journal of Applied Physics, 1982
Transmission electron microscopy and Auger electron spectroscopy studies of boron implanted silicon single crystals
Physica Status Solidi (a), 1981
Ion-implantation conditions and annealing effects for contiguous disk bubble devices
IEEE Transactions on Magnetics, 1980
Irradiation induced crystalline to amorphous transition
Solid State Communications, 1980
Crystalline and magnetic properties of an ion-implanted layer in bubble garnet films
Journal of Applied Physics, 1978