Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry
- 23 October 2001
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 17 (24) , 7529-7534
- https://doi.org/10.1021/la001528k
Abstract
No abstract availableKeywords
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