Validity of Ellipsometry for Determining the Average Thickness of Thin, Discontinuous, Absorbing Films*
- 1 June 1969
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 59 (6) , 675-681
- https://doi.org/10.1364/josa.59.000675
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 18 references indexed in Scilit:
- Ellipsometry for Measurements at and below Monolayer CoverageJournal of the Optical Society of America, 1968
- A Comparative Study of Adsorption by Ellipsometric and Radiotracer MethodsThe Journal of Physical Chemistry, 1966
- Infrared Reflectance and Emittance of Silver and Gold Evaporated in Ultrahigh VacuumApplied Optics, 1965
- Infrared Reflectance of Evaporated Aluminum FilmsJournal of the Optical Society of America, 1962
- Simplified Treatment of EllipsometryJournal of the Optical Society of America, 1958
- Multiple-Beam Fringes of Equal Chromatic Order Part III The Cleavage of TopazJournal of the Optical Society of America, 1953
- Optical Properties of Surface Films. IIReview of Scientific Instruments, 1949
- An optical examination of thin films. II.—The behaviour of thin films of fatty acids on mercuryProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1934
- The reflexion of light at a surface covered by a monomolecular filmMathematical Proceedings of the Cambridge Philosophical Society, 1933
- XII. Colours in metal glasses and in metallic filmsPhilosophical Transactions of the Royal Society A, 1904