Simplified Treatment of Ellipsometry

1 January 1958

journal article
Published by Optica Publishing Group in Journal of the Optical Society of America

Vol. 48 (1) , 51-53
https://doi.org/10.1364/josa.48.000051

Abstract

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Keywords

This publication has 6 references indexed in Scilit:

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Annals of the New York Academy of Sciences, 1951
Optical Properties of Surface Films. II
Review of Scientific Instruments, 1949
The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films
Review of Scientific Instruments, 1945
The investigation of thin surface films on metals by means of reflected polarized light
Transactions of the Faraday Society, 1933
Ueber Oberflächenschichten. II. Theil
Annalen der Physik, 1889
Ueber das Verhältniss der Cauchy'schen Theorie der Metallreflexion zu der Voigt'schen
Annalen der Physik, 1888