PEST: A Tool for Implementing Pseudo-Exhaustive Self-Test
- 2 January 1991
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in AT&T Technical Journal
- Vol. 70 (1) , 87-100
- https://doi.org/10.1002/j.1538-7305.1991.tb00499.x
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Logic Test Pattern Generation Using Linear CodesIEEE Transactions on Computers, 1984
- Verification Testing—A Pseudoexhaustive Test TechniqueIEEE Transactions on Computers, 1984
- Exhaustive Test Pattern Generation with Constant Weight VectorsIEEE Transactions on Computers, 1983
- Exhaustive Generation of Bit Patterns with Applications to VLSI Self-TestingIEEE Transactions on Computers, 1983
- Design for Autonomous TestIEEE Transactions on Computers, 1981