Physical subthreshold MOSFET modeling applied to viable design of deep-submicrometer fully depleted SOI low-voltage CMOS technology
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 42 (9) , 1605-1613
- https://doi.org/10.1109/16.405274
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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