Interdiffusion of Au/Ni/cr on Silicon Substrate
- 1 January 1988
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The diffusion of platinum and gold in nickel measured by Rutherford backscattering spectrometryThin Solid Films, 1983
- Auger study of Cr/Au thin films deposited on alumina and sapphireThin Solid Films, 1980
- The increase in the electrical resistance of heat-treated Au/Cr filmsThin Solid Films, 1980
- Interdiffusion of thin Cr and Au films deposited on siliconThin Solid Films, 1976
- Interdiffusion in thin conductor films — chromium/gold, nickel/gold and chromium silicide/goldMetallurgical Transactions, 1971
- GRAIN BOUNDARY SELF-DIFFUSION IN CHROMIUM NEAR THE MELTING POINTApplied Physics Letters, 1966