Quantitative energy dispersive X-ray analysis of BiSrCaCuO compounds using standards
- 28 February 1993
- journal article
- Published by Elsevier in Applied Superconductivity
- Vol. 1 (1-2) , 121-129
- https://doi.org/10.1016/0964-1807(93)90388-i
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Artifacts of specimen charging in X-ray microanalysis in the scanning electron microscopeUltramicroscopy, 1991
- X-ray microanalysis of thin crystals in the electron microscope and its application to solid-state chemistryAnalytical Chemistry, 1981
- The quantitative analysis of thin specimensJournal of Microscopy, 1975