Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors
- 15 February 1999
- journal article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 59 (8) , 5479-5492
- https://doi.org/10.1103/physrevb.59.5479
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
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