The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAs
- 1 December 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 19 (1) , 81-89
- https://doi.org/10.1016/0040-6090(73)90026-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A Rutherford scattering study of the chemical composition of native oxides on GaPJournal of Physics and Chemistry of Solids, 1973
- Anodic Oxide Films on GaPJournal of the Electrochemical Society, 1973
- X-Ray Production by Alpha-Particle ImpactPhysical Review A, 1971