Tunnel and Sehottky Current in Dielectric Thin Films Considering Film Thickness Fluctuations
- 1 January 1967
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 24 (1) , 89-94
- https://doi.org/10.1002/pssb.19670240108
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Influence of non-uniform thickness of dielectric layers on capacitance and tunnel currentsSolid-State Electronics, 1966
- INTERPRETATION OF TUNNEL EMISSION AND CAPACITANCE MEASUREMENTS IN THE PRESENCE OF DIELECTRIC FILM-THICKNESS FLUCTUATIONSApplied Physics Letters, 1966
- Photoemissive Determination of Barrier Shape in Tunnel JunctionsPhysical Review Letters, 1965
- Tunneling Through Asymmetric BarriersJournal of Applied Physics, 1964
- Electric Tunnel Effect between Dissimilar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963
- Effect of Insulating-Film-Thickness Nonuniformity on Tunnel CharacteristicsJournal of Applied Physics, 1963
- Volt-current characteristics for tunneling through insulating filmsJournal of Physics and Chemistry of Solids, 1962