Offset reduction in multicollector magnetotransistors
- 23 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 537-540
- https://doi.org/10.1109/iedm.1996.554040
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Temperature calibration of CMOS magnetic vector probe for contactless angle measurement systemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A lateral magnetotransistor structure with a linear response to the magnetic fieldIEEE Transactions on Electron Devices, 1989