Temperature calibration of CMOS magnetic vector probe for contactless angle measurement system
- 23 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 533-536
- https://doi.org/10.1109/iedm.1996.554037
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Offset reduction in multicollector magnetotransistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- First three-dimensional numerical analysis of magnetic vector probePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Magnetotransistors in SOI technologyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Magnetotransistor in CMOS technologyIEEE Transactions on Electron Devices, 1986
- Analysis and Simulation of Semiconductor DevicesPublished by Springer Nature ,1984