Full Frequency Back-Action Spectrum of a Single-Electron Transistor during Qubit Readout
- 10 January 2002
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 88 (4) , 046802
- https://doi.org/10.1103/physrevlett.88.046802
Abstract
We calculate the spectral density of voltage fluctuations in a single-electron transistor (SET), biased to operate in a transport mode where tunneling events are correlated due to Coulomb interaction. The whole spectrum from low frequency shot noise to quantum noise at frequencies comparable to the SET charging energy is considered. We discuss the back-action during readout of a charge qubit and conclude that single-shot readout is possible using the radio-frequency SET.
Keywords
All Related Versions
This publication has 11 references indexed in Scilit:
- Quantum-state engineering with Josephson-junction devicesReviews of Modern Physics, 2001
- Radio-Frequency Single-Electron Transistor as Readout Device for Qubits: Charge Sensitivity and BackactionPhysical Review Letters, 2001
- Statistics and Noise in a Quantum Measurement ProcessPhysical Review Letters, 2000
- Amplifying quantum signals with the single-electron transistorNature, 2000
- Single-spin measurement using single-electron transistors to probe two-electron systemsPhysical Review B, 2000
- Coherent control of macroscopic quantum states in a single-Cooper-pair boxNature, 1999
- The Radio-Frequency Single-Electron Transistor (RF-SET): A Fast and Ultrasensitive ElectrometerScience, 1998
- Quantum Coherence with a Single Cooper PairPhysica Scripta, 1998
- Mesoscopic quantum transport: Resonant tunneling in the presence of a strong Coulomb interactionPhysical Review B, 1994
- Finite-frequency shot noise in a correlated tunneling currentPhysical Review B, 1993