Characterization of boron nitride films prepared by the dual ion beam deposition technique
- 30 September 1990
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 7 (1-2) , 107-110
- https://doi.org/10.1016/0921-5107(90)90014-3
Abstract
No abstract availableKeywords
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