Detection of Resistivity Striations in a Ge Crystal with an Electron Beam
- 1 April 1966
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 5 (4)
- https://doi.org/10.1143/jjap.5.336
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Measurement of the Homogenity of a Semiconductor with an Electron BeamJapanese Journal of Applied Physics, 1965
- Bulk Electron Voltaic EffectJapanese Journal of Applied Physics, 1965
- Resistivity Striations in Germanium Single CrystalsJournal of the Physics Society Japan, 1961