Measurements of charge accumulation induced by monochromatic low-energy electrons at the surface of insulating samples
- 1 September 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 84 (5) , 2740-2748
- https://doi.org/10.1063/1.368388
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
- Nanoscopic aspects of electronic aging in dielectricsIEEE Transactions on Dielectrics and Electrical Insulation, 1997
- Thermoelectronic breakdown with pressure and space charge effects in polyethyleneJournal of Applied Physics, 1997
- Aging in wire insulation under multifactor stressIEEE Transactions on Electrical Insulation, 1993
- Dielectric polarization invariance in dissociative electron attachment from condensed saturated hydrocarbonsThe Journal of Physical Chemistry, 1991
- Absolute cross section for dissociative electron attachment incondensed on Kr filmPhysical Review Letters, 1990
- Mechanisms of Charge Trapping at a Dielectric Surface: Resonance Stabilization and Dissociative AttachmentPhysical Review Letters, 1988
- The physics of electrical breakdown and prebreakdown in solid dielectricsPublished by Springer Nature ,1987
- Forward Electron Scattering in Benzene; Forbidden Transitions and Excitation FunctionsHelvetica Chimica Acta, 1982
- Transmission of 0–15 eV monoenergetic electrons through thin-film molecular solidsThe Journal of Chemical Physics, 1979
- Characteristics of the Trochoidal Electron MonochromatorReview of Scientific Instruments, 1970