Measurement of the effective carrier lifetime by a distortion technique
- 31 May 1967
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 10 (5) , 445-448
- https://doi.org/10.1016/0038-1101(67)90043-3
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- On the variation of the lifetime of minority carriers in a junction transistor with the level of injectionSolid-State Electronics, 1964
- An experimental determination of the carrier lifetime in p-i-n diodes from the stored carrier chargeSolid-State Electronics, 1964