SIMCON: a versatile software package for the simulation of electron diffraction contrast images of arbitrary displacement fields
- 1 November 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 45 (3-4) , 323-335
- https://doi.org/10.1016/0304-3991(92)90143-8
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Micro-Raman study of stress distribution in local isolation structures and correlation with transmission electron microscopyJournal of Applied Physics, 1992
- Published by AIP Publishing ,1991
- Strain contrast of coherent precipitates in bright-field images under zone axis incidencePhilosophical Magazine A, 1990
- Film-edge-induced dislocation generation in silicon substrates. I. Theoretical modelJournal of Applied Physics, 1987
- Electron Microscope Image Contrast from Dislocation LoopsPhysica Status Solidi (b), 1971
- Diffraction contrast from spherically symmetrical coherency strainsPhilosophical Magazine, 1963
- Diffraction contrast of electron microscope images of crystal lattice defects - II. The development of a dynamical theoryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1961