FALP studies of the dissociative recombination coefficients for O2+ and NO+ within the electron temperature range 300–2000 K
- 1 November 1993
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 129, 183-191
- https://doi.org/10.1016/0168-1176(93)87041-p
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Studies of Electron Attachment at Thermal Energies Using the Flowing Afterglow–Langmuir Probe TechniquePublished by Elsevier ,1994
- FALP studies of electron attachment at elevated electron temperatures: the influence of attachment on electron energy distributionsInternational Journal of Mass Spectrometry and Ion Processes, 1993
- Electron-temperature dependence of the recombination of H3O+(H2O)n ions with electronsThe Journal of Chemical Physics, 1993
- Microwave afterglow measurements of the dissociative recombination of molecular ions with electronsInternational Journal of Mass Spectrometry and Ion Processes, 1987
- Electron temperature dependence of the recombination of electrons withionsPhysical Review A, 1987
- Measurements of dissociative recombination coefficients of H+3, HCO+, N2H+, and CH+5 at 95 and 300 K using the FALP apparatusThe Journal of Chemical Physics, 1984
- Measurements of the dissociative recombination coefficients of O2+, NO+and NH4+in the temperature range 200-600KJournal of Physics B: Atomic and Molecular Physics, 1983
- Merged electron-ion beam experiments. III. Temperature dependence of dissociative recombination for atmospheric ions NO+, O2+and N2+Journal of Physics B: Atomic and Molecular Physics, 1979
- Merged electron-ion beam experiments. I. Method and measurements of (e-H2+) and (e-H3+) dissociative-recombination cross sectionsJournal of Physics B: Atomic and Molecular Physics, 1977
- Dissociative RecomibnationPublished by Elsevier ,1970