Recombination-induced heating of free carriers in a semiconductor
- 15 April 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 31 (8) , 5490-5493
- https://doi.org/10.1103/physrevb.31.5490
Abstract
Recombination of externally excited (injected) charge carriers in a semiconductor can strongly change the temperature of the remaining carriers. The temperature is increased if the recombination rate decreases with energy and/or degenerate statistics applies. The normalized heating rate (the recombination rate) will thus drastically reduce energy relaxation (cooling) of hot carriers at low temperatures. Cooling may occur if the recombination rate increases with energy.
Keywords
This publication has 6 references indexed in Scilit:
- Localization induced electron-hole transition rate enhancement in GaAs quantum wellsApplied Physics Letters, 1984
- Phonon optics in semiconductors: Phonon generation and electron-phonon scattering in-GaAs epilayers: I. TheoryPhysical Review B, 1981
- Optical properties of highly excited direct gap semiconductorsPhysics Reports, 1981
- Picosecond Relaxation Processes of High Density Electron–Hole Plasma in CdSePhysica Status Solidi (b), 1981
- Thermalization of the Electron—Hole Plasma in GaAs.Physica Status Solidi (b), 1978
- Is the deformation potential in semiconductors screened by free carriers?Journal of Physics C: Solid State Physics, 1977