MOSFET test structures for two-dimensional device simulation
- 1 January 1995
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 38 (1) , 69-73
- https://doi.org/10.1016/0038-1101(94)e0050-o
Abstract
No abstract availableKeywords
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- A simple theory to predict the threshold voltage of short-channel IGFET'sSolid-State Electronics, 1974