Counter-diffractometer parameter determination of polycrystalline U3Si
- 30 April 1973
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 46 (3) , 303-308
- https://doi.org/10.1016/0022-3115(73)90045-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- X-ray diffraction data on U3SiJournal of Applied Crystallography, 1971
- Crystal chemical studies of the 5f-series of elements. VIII. Crystal structure studies of uranium silicides and of CeSi2, NpSi2, and PuSi2Acta Crystallographica, 1949