An Instrument for Layer Thickness Measurement Using Pseudo-Sezawa Waves
- 1 January 1986
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1031-1036
- https://doi.org/10.1109/ultsym.1986.198894
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Material Characterization by the Inversion of V(z)IEEE Transactions on Sonics and Ultrasonics, 1985
- Application of Reflection Coefficient Dip to Layer Thickness Measurement by Acoustic MicroscopeJapanese Journal of Applied Physics, 1985
- A New Method of Measuring Surface Layer-Thickness Using Dips in Angular Dependence of Reflection CoefficientsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984